{"product_id":"9780415303972","title":"Analysis of Residual Stress by Diffraction using Neutron and Synchrotron Radiation","description":"\u003cp\u003eNeutron and synchrotron X-ray diffraction have emerged as leading techniques for stress analysis. This book presents an overview of the principles of these techniques and examples of their applications to a range of materials and engineering problems. It contains 20 papers from leading international experts in residual stress analysis covering the\u003c\/p\u003e","brand":"CRC Press","offers":[{"title":"Default Title","offer_id":48678412583147,"sku":"00000_00000_00000_00000","price":640.92,"currency_code":"SGD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0758\/4484\/5803\/files\/9780415303972-1.jpg?v=1781620799","url":"https:\/\/kinokuniya.com.sg\/ja\/products\/9780415303972","provider":"Books Kinokuniya Singapore","version":"1.0","type":"link"}