{"product_id":"9780471584896","title":"Electromigration and Electronic Device Degradation","description":"\u003cp\u003eThis study reviews an important reliability issue for both silicon and GaAs technologies. It surveys the status of electromigration physics in microelectronics, and summarizes various rate controlling details.\u003c\/p\u003e","brand":"Wiley-Interscience","offers":[{"title":"Default Title","offer_id":48674770682091,"sku":"00000_00000_00000_00000","price":508.98,"currency_code":"SGD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0758\/4484\/5803\/files\/9780471584896-1.jpg?v=1785753420","url":"https:\/\/kinokuniya.com.sg\/ja\/products\/9780471584896","provider":"Books Kinokuniya Singapore","version":"1.0","type":"link"}