{"product_id":"9783662231302","title":"Quantitative Electron Microprobe Analysis (Softcover reprint of the original 1st ed. 1965. 1965. iv, 170 S. 11 SW)","description":"\u003cp\u003eThe Electron \"licroprobe X-!{ay Analyscr conceivcd b~' R C.\\\\S'L\\\\I:\\\\G and A. Cl'!:'\\\\ lEI( in 1949 has been developcd as an extremelv po\\\\\\\\'crful tool in spcctrochcmical analysis for a wide range of applications, ranging from qualitative elcmcntary distribution studies, to highly localiscd quantitatin analysis on a one micron scale. \\\\\\\\'ith the increasing number oi' versatile instruments, commcrcially available, the domain of applications - in metallurgy, solid state physics, mineralogy and geology, biology and medicine, arts and archeology - is rapidly expanding, particularly because reliable quantitative analyses can be achieved. It is well established that in multicomponent specimens, the relative x-ray intensity generated by the electron bombardment - i.e. the intensity ratio of the characteristic x-ray radiation emitted under identical experimental conditions by the specimen and a calibration standard - is not directly correlated to the elementary mass concentration. The use of a wide scale of carefully prepared homogeneous calibration standards is generally very tedious and restricted to binar)' systems. For more complex specimens, the conversion of recorded x-ra)' intensity ratios to elementary mass concentration requires, besides carefule selection of experimental conditions, an adequate correction calculation to take account oi' the various physical phenomenas occurring in the tarp;et - electron retardation, electron backseattering, x-ray excitation efficieney, fluorescence enhaneement by eharaeteristic and continuous radiation and x-ray mass absorption. 1 General Features of Electron Microprobe Analysis.- 2 Fundamentals of Quantitative Electron Microprobe Analysis.- 3 Procedures for Correction Calculation.- 4 Detection Limit, Detection Threshold and Microprobe Trace Analysis.- References.- Annexed Tables.- A) Characteristic Wavelength and Excitation Potentials for K, L, M Series.- B) Determination of Effective Lenard Coefficients.- C) Table of the Electron Penetration Factor.- D) X-Ray Mass Absorption Coefficients.- E) Variation of Effective Electron Current (backscattering factor).- F) Determination of the Efficiency Function 1\/f(x).\u003c\/p\u003e","brand":"SPRINGER, BERLIN; SPRINGER BERLIN HEIDELBERG; SPRINGE","offers":[{"title":"Default Title","offer_id":48759862984939,"sku":"00000_00000_00000_00000","price":100.69,"currency_code":"SGD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0758\/4484\/5803\/files\/9783662231302-1.jpg?v=1781728153","url":"https:\/\/kinokuniya.com.sg\/ja\/products\/9783662231302","provider":"Books Kinokuniya Singapore","version":"1.0","type":"link"}