{"product_id":"9789814451208","title":"Electromigration Modeling at Circuit Layout Level (SpringerBriefs in Applied Sciences and Technology)","description":"\u003cp\u003eIntegrated circuit (IC) reliability is of increasing concern in present-day IC technology where the interconnect failures significantly increases the failure rate for ICs with decreasing interconnect dimension and increasing number of interconnect levels.\u003c\/p\u003e","brand":"Springer","offers":[{"title":"Default Title","offer_id":48776321761515,"sku":"00000_00000_00000_00000","price":100.69,"currency_code":"SGD","in_stock":true}],"url":"https:\/\/kinokuniya.com.sg\/ja\/products\/9789814451208","provider":"Books Kinokuniya Singapore","version":"1.0","type":"link"}