{"product_id":"9780198501893","title":"Defect and Microstructure Analysis by Diffraction (International Union of Crystallography Monographs on Crystallography)","description":"\u003cp\u003eExamines the state of the art for determining the \"real\" structure of matter. This book provides an analysis of the fundamental theory and techniques for microstructure analysis from diffraction patterns. It presents the principal characterization technique permitting us to measure the defect solid state: X-ray diffraction.\u003c\/p\u003e","brand":"Oxford University Press","offers":[{"title":"Default Title","offer_id":48662780838123,"sku":"00000_00000_00000_00000","price":833.19,"currency_code":"SGD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0758\/4484\/5803\/files\/9780198501893-1.jpg?v=1781610908","url":"https:\/\/kinokuniya.com.sg\/products\/9780198501893","provider":"Books Kinokuniya Singapore","version":"1.0","type":"link"}