{"product_id":"9780367400637","title":"High Resolution X-Ray Diffractometry and Topography","description":"\u003cp\u003eThe rapid growth in the applications of electronic materials has created an increasing demand for reliable techniques for examining and characterizing these materials. This book explores the area of x-ray diffraction and the techniques available for deployment in research, development, and production. It maps the theoretical and practical background necessary to study single crystal materials using high resolution x-ray diffraction and topography. It combines mathematical formalism with graphical explanations and hands-on advice for interpreting data, thus providing the theoretical and practical background for applying these techniques in scientific and industrial materials characterization.\u003c\/p\u003e","brand":"CRC Press","offers":[{"title":"Default Title","offer_id":48695190552811,"sku":"00000_00000_00000_00000","price":181.27,"currency_code":"SGD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0758\/4484\/5803\/files\/9780367400637-1.jpg?v=1781617425","url":"https:\/\/kinokuniya.com.sg\/products\/9780367400637","provider":"Books Kinokuniya Singapore","version":"1.0","type":"link"}