{"product_id":"9781402083624","title":"CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies : Process-Aware SRAM Design and Test (Frontiers in Electronic Testing) \u003cVol. 40\u003e","description":"\u003cp\u003eCMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies covers a broad range of topics related to SRAM design and test. From SRAM operation basics through cell electrical and physical design to process-aware and economical approach to SRAM testing.\u003c\/p\u003e","brand":"Springer","offers":[{"title":"Default Title","offer_id":48914987122923,"sku":"00000_00000_00000_00000","price":329.59,"currency_code":"SGD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0758\/4484\/5803\/files\/9781402083624-1.jpg?v=1783100034","url":"https:\/\/kinokuniya.com.sg\/products\/9781402083624","provider":"Books Kinokuniya Singapore","version":"1.0","type":"link"}