{"product_id":"9781461375616","title":"Delay Fault Testing for VLSI Circuits (Frontiers in Electronic Testing) (SPI)","description":"\u003cp\u003eIn that sense, this book is the best x DELAY FAULT TESTING FOR VLSI CIRCUITS available guide for an engineer designing or testing VLSI systems. Tech­ niques for path delay testing and for use of slower test equipment to test high-speed circuits are of particular interest.\u003c\/p\u003e","brand":"Springer Verlag","offers":[{"title":"Default Title","offer_id":48931884597483,"sku":"00000_00000_00000_00000","price":311.28,"currency_code":"SGD","in_stock":true}],"url":"https:\/\/kinokuniya.com.sg\/products\/9781461375616","provider":"Books Kinokuniya Singapore","version":"1.0","type":"link"}