{"product_id":"9781643279107","title":"An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science (Iop Concise Physics)","description":"\u003cp\u003eHighlights the application of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) for high-resolution surface analysis and characterization of materials. While providing a brief overview of the principles of SIMS, the book also provides examples of how dual-beam ToF-SIMS is used to investigate a range of materials systems and properties.\u003c\/p\u003e","brand":"Morgan \u0026 Claypool Publishers","offers":[{"title":"Default Title","offer_id":48786468143339,"sku":"00000_00000_00000_00000","price":219.74,"currency_code":"SGD","in_stock":true}],"url":"https:\/\/kinokuniya.com.sg\/products\/9781643279107","provider":"Books Kinokuniya Singapore","version":"1.0","type":"link"}