{"product_id":"9783030067472","title":"Metal Impurities in Silicon- and Germanium-Based Technologies : Origin, Characterization, Control, and Device Impact (Springer Series in Materials Science .270) (Softcover reprint of the original 1st ed. 2018. 2019. xxxiii, 438 S. X)","description":"\u003cp\u003ematerial science, defect engineering, device processing, defect and device characterization, and device physics and engineering.\u003c\/p\u003e","brand":"SPRINGER, BERLIN; SPRINGER INTERNATIONAL PUBLISHING;","offers":[{"title":"Default Title","offer_id":48814684307691,"sku":"00000_00000_00000_00000","price":366.22,"currency_code":"SGD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0758\/4484\/5803\/files\/9783030067472-1.jpg?v=1783558777","url":"https:\/\/kinokuniya.com.sg\/zh\/products\/9783030067472","provider":"Books Kinokuniya Singapore","version":"1.0","type":"link"}