Testing and Reliable Design of CMOS Circuits (The Springer International Series in Engineering and Computer Science) (Reprint)

311.28 SGD
会員価格
280.16
English

Product Description

In the last few years CMOS technology has become increas­ ingly dominant for realizing Very Large Scale Integrated (VLSI) circuits. However, the rapid advance­ ments in this area pose many new problems in the area of testing. Today many universities offer courses in the areas of digital system testing and fault-tolerant computing.

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