Testing and Reliable Design of CMOS Circuits (Kluwer International Series in Engineering and Computer Science)

311.28 SGD
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280.16
English

Product Description

In the last few years CMOS technology has become increas­ ingly dominant for realizing Very Large Scale Integrated (VLSI) circuits. However, the rapid advance­ ments in this area pose many new problems in the area of testing. Today many universities offer courses in the areas of digital system testing and fault-tolerant computing.

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