将鼠标悬停在图片上即可放大

Hierarchical Modeling for VLSI Circuit Testing (The Springer International Series in Engineering and Computer Science 89) (1989. 176 S. 235 mm)

Name: Hierarchical Modeling for VLSI Circuit Testing (The Springer International Series in Engineering and Computer Science 89) (1989. 176 S. 235 mm)
Brand: SPRINGER, BERLIN
SKU: 00000_00000_00000_00000
Price: 201.41 SGD
Availability: InStock

Bhattacharya, Debashis/ Hayes, John P.

201.41 SGD

Member Price

181.27

English

Quantity:

Product Description

To match this high-level circuit model, we introduce a high-level bus fault that, in effect, replaces a large number of SSL faults and allows them to be tested in parallel.

... Read Full Text

Publisher

SPRINGER, BERLIN

Publication Date

ISBN

9780792390589

Pages

176

Item Type

Book

Format

Hardcover

Available to Order

Usually dispatches within 3-4 weeks

While every attempt has been made to ensure stock availability, occasionally we may run out of stock at our stores.

Free domestic shipping on orders over 50.00SGD

您的购物车

Hierarchical Modeling for VLSI Circuit Testing (The Springer International Series in Engineering and Computer Science 89) (1989. 176 S. 235 mm)

Product Description

Available to Order

Hierarchical Modeling for VLSI Circuit Testing (The Springer International Series in Engineering and Computer Science 89) (1989. 176 S. 235 mm)

Recently Viewed Items

Related Products