Digital Hardware Testing : Transistor-level Fault Modeling and Testing (Materials Library S.)

260.03 SGD
Member Price
234.03
English

Product Description

Digital Hardware Testing presents realistic transistor-level fault models and testing methods for all types of circuits. The discussion details design-for-testability and built-in self-test methods, with coverage of boundary scan and emerging technologies such as partial scan, cross check, and circular self-test-path.

Providing details on state-of-the-art methods and trends in testing, this book describes the test methods and how they work, and when and why they should by applied for maximum effect. It contains reviews of well-established methods, as well as information on future test methodologies.

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