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Design, Analysis and Test of Logic Circuits under Uncertainty (Lecture Notes in Electrical Engineering)

Krishnaswamy, Smita/ Markov, Igor L./ Hayes, John P.
201.41 SGD
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181.27
English

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Logic circuits are becoming increasingly susceptible to probabilistic behavior caused by external radiation and process variation. Ensuring the reliability of such circuits despite the probabilistic behavior is a key challenge in IC design---one that necessitates a fundamental, probabilistic reformulation of synthesis and testing techniques.

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