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Structural, Syntactic, and Statistical Pattern Recognition : Joint Iapr International Workshops, Sspr 2006 and Spr 2006, Hong Kong, China, August 17-1

Name: Structural, Syntactic, and Statistical Pattern Recognition : Joint Iapr International Workshops, Sspr 2006 and Spr 2006, Hong Kong, China, August 17-1
Brand: Springer Verlag
SKU: 00000_00000_00000_00000
Price: 201.41 SGD
Availability: InStock

Yeung, Dit-Yan (EDT)/ Kwok, James T. (EDT)/ Fred, Ana (EDT)/ Roli, Fab

201.41 SGD

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181.27

English

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Product Description

Invited Talks.- SSPR.- Poster Papers.- SPR.- Poster Papers.

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Publisher

Springer Verlag

Publication Date

Sep 2006

ISBN

9783540372363

Pages

939 p.

Item Type

Book

Format

Paperback

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Structural, Syntactic, and Statistical Pattern Recognition : Joint Iapr International Workshops, Sspr 2006 and Spr 2006, Hong Kong, China, August 17-1

Product Description

Available to Order

Structural, Syntactic, and Statistical Pattern Recognition : Joint Iapr International Workshops, Sspr 2006 and Spr 2006, Hong Kong, China, August 17-1

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