Metal Impurities in Silicon- and Germanium-Based Technologies : Origin, Characterization, Control, and Device Impact (Springer Series in Materials Science)

Name: Metal Impurities in Silicon- and Germanium-Based Technologies : Origin, Characterization, Control, and Device Impact (Springer Series in Materials Science)
Brand: Springer
SKU: 00000_00000_00000_00000
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Claeys, Cor/ Simoen, Eddy

366.22 SGD

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English

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Springer

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9783319939247

Pages

207 illus. in color/435

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Book

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Hardcover

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Metal Impurities in Silicon- and Germanium-Based Technologies : Origin, Characterization, Control, and Device Impact (Springer Series in Materials Science)

Available to Order

Metal Impurities in Silicon- and Germanium-Based Technologies : Origin, Characterization, Control, and Device Impact (Springer Series in Materials Science)

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